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Description

Carbon Mount 9.5mm dia. x 9.5mm lengthDESCRIPTION All our carbon SEM specimen mounts are made from spectrographically pure, the highest purity grade, graphite rods. Total impurity level does not exceed 2ppm and typically less than 1ppm per element. These mounts are ideal for analytical SEM and microprobe work since the only element which can be detected with EDS or WDS systems in their specimen mounts is C. Both electron and X ray absorption is much higher than compared with the standard

stainless steel

SURFACE SURFACE ENERGY (mJ/m2) STANDARD DEVIATION Silicon Nitride Membrane 46

Each unmounted probe comes with six different cantilevers of various dimensions

DNP probes have less than 2deg of cantilever bend

25° angle

All cantilevers on the Silicon Nitride probes have less than 2 degrees of cantilever bend

There is no coating on the Si surface

Not compatible with LFM SPMs

10 nm radius

Silver content >60% by weight

67 ltr/sec turbo pump on a 150mm outer diameter chamber gives rapid pumpdown

polishing and other machining processes