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Description

ATEC-EFMDESCRIPTION AdvancedTEC Silicon SPM Probe, silicon cantilever for force modulation mode, detector and tip side: Pt Ir coating

The 607-STM Grating Replica is a carbon replica with Au/Pd shadowing for X-Y calibration with 2

Rework or remove with hot soldering iron

The larger gold particles

Pin Stub SEM Mount Grippers

07 cal/cm2/sec/C/cm

54484 - Diamond Scriber Head: Straight

The S-4 mount adapter allows the use of the S-4 specimen mounts (Cambridge Instruments

paint chips and films

solid aluminum with stainless steel locking screws

Viscosity 33

Electron Microscopy: SEM and FIB/SEM (secondary & backscattered electrons)

Turning the knob at the top of the clamp clockwise raises the piston for easy sample placement

Exchange/Return Notes

We offer a 30-day return/exchange service after receiving.
Final sale items are not eligible for returns or exchanges.
To process your return/exchange, please contact us at [email protected]
Please click here for more details>>> Return & Exchange Policy

Shipping Notes

Free Standard Shipping on $100+ Orders to the USA.
Except Preorder products are shipped in 48 hours.
Delivery to the USA:

Standard Shipping : 3-10 business days

If time is of the essence, please consider selecting expedited delivery for faster service.

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