Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test Ingestion-build-258901 c) The definition of which

c)      The definition of which average detector is used for emission measurements at frequencies above 1GHz and that results using a peak detector are acceptable for all measurements

and interpreting the data generated by near field scan (NFS) measurement

This standard has been written for manufacturers of health software

operating and maintaining the equipment in the manner prescribed by the manufacturer

Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test Ingestion-build-258901 c) The definition of which1 Scope This part of IEC 60749 provides a steady state temperature and humidity bias life test for the purpose of evaluating the reliability of non hermetic packaged solid state devices in humid environments. This test method is considered destructive.