Semiconductor devices. Mechanical and climatic test methods - Preconditioning of non-hermetic surface mount devices prior to reliability testing Ingestion-build-221493 This Technical Specification is not

This Technical Specification is not designed or intended for use in other parts or activities of the food supply chain

Greater thicknesses for SAWL hollow sections can be agreed provided the technical requirements of this European Standard are maintained

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Semiconductor devices. Mechanical and climatic test methods - Preconditioning of non-hermetic surface mount devices prior to reliability testing Ingestion-build-221493 This Technical Specification is notWhat is BS EN IEC 6074930 about? BS EN IEC 6074930 is the 30th part of the multimerise Internation standard on semiconductor devices. BS EN IEC 6074930 establishes a standard procedure for determining the preconditioning of non hermetic surface mount devices (SMDs) prior to reliability testing. Note: Correlation of moisture induced stress sensitivity conditions (or moisture sensitivity levels (MSL)) in accordance with IEC 60749 20 and this document