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Description

PR-EX-CAFM-5DESCRIPTION 5 pack of contact mode probes compatible with the nanoIR2 2s 2FS, nanoIR, and afm+ for CAFM measurements and contact mode imaging. Microfabricated silicon probes that are ~450 microns long and are coated with ~25 nm of PtIr conductive coating on both sides of the cantilever. Premounted on half washer mounts with a two pin connector for easy exchange and electrical connection to the CAFM module. Requires the CAFM module.

5 Front Angle: 25 ± 5 Back Angle: 15 ± 5 Side Angle: 22

Usability: The calibrated pattern covers the entire chip

Imaging in both secondary and back scattered mode is very high

During scanning in contact mode using a 0

160 lines/mm crossed lines

50 nm full carbon CD probe

without Protective Retainer

Tip storage kit with gel for silicon cantilevers DESCRIPTION

Cantilever Material: Diamond Cantilever Thickness (Nom): 4

-- Seals cell against FFKM boot (EC-V2-CH BOOT) upon engage

Low vertical edge height

Conductive Adhesives Comparison Table