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Description

Low profile 36° FIB mount with short pin (6mm) for ZEISS/LEODESCRIPTION These special low profile pin mounts are available as flat, as a 90 mount, and with specific angles ideally suited to accommodate specimens with small working distances in FIB, DualBeam and CrossBeam systems. Made out of aluminum. Fully compatible with standard pin stub mounts (pin 3. 2mm diameter) for sample storage and transport. These mounts can be used directly in FEI and TESCAN systems with the standard pin length and ZEISS LEO

A variety pack of tipless calibration levers with three different spring constants

Fused Quartz Standard

extra fine tips 5 110mm NM-SS 0

Bruker's MESP-HM-V2 is the established choice for Magnetic Force Microscopy

Polished 1

Aspect ratio of 20:1 at 2um from tip apex

43mm 5043-SV-1 ESD Safe

Prod # Description Style Length Metal Points - Width x Thickness 5367-6G PELCO® Pro Gold Plated Anti Capillary

electrically conductive tip that is ideal for various electrical characterization applications

Superb quality and craftsmanship

6mm diameter DESCRIPTION

The mechanical and chemical stability allow for cleaning of the Silicon Nitride Support Films with chemicals (solvents