Thoughtful delivery service

Easy 30 day returns

Certified Reviews

Description

SEM Bulk Specimen HolderDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain

irregular samples

670-400-CU-100 - Ultrathin Carbon on Quantifoil®

50 and 200nm

These special low profile pin mounts are available as flat

The trench type groove makes it easy to measure the pitch

5 mm silicone evaporation covers DESCRIPTION

Other applications of the DDESP-V2 probe include: Scanning Capacitance Microscopy (SCM)

Non-Magnetic

Orthogonal Array of 2µm Diameter Holes with about 2µm Separation – (R 2/2)

Holds three geological or petrographic cross sections up to 47 x 27mm

they also make a low cost alternative for multi-user facilities

Principles and Techniques of Electron Microscopy Biological Applications