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Description

MSCTSharpened, 6 levers, 0. 01 0. 50N m, Au Reflex Coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Bruker's sharpened Microlever AFM probes have soft Silicon Nitride cantileverswith sharpened Silicon Nitride tips, and are ideal for contact imaging modes,force modulation microscopy, and liquid operation. The range in forceconstants enables users to image extremely soft samples in contact modeas well as high load vs distance spectroscopy.

This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model RFESPA-75

MLCT-BIO-DC is a low thermal sensitivity version of the probe that is available for heated applications that can cause probe bending or drift

so substantial tip angle decreases more when it is attached to a chip holder in your AFM with certain tilt angle (probably

Bruker also offers solid diamond probes with pyramidal tips

633nm laser excitation and 1 sec integration

Unmounted for use on standardAFM's

Sharp Conductive Single Crystal Diamond Probes

These tips are formed from a platinum/iridium wire and cut at the end to form the tip

Unmounted for use on any AFM

Movie playback speed 9x

9 Cantilever Geometry: Rectangular Cantilevers Number: 1 Back Side Coating: TiW/Au (500)

sensitivity