Thoughtful delivery service

Easy 30 day returns

Certified Reviews

Description

ESPA-V20. 2N m, 13kHz, 4 Sided Tip, Al Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for contact mode imaging in air. Unmounted for use on standard AFM's. Bruker AFM Probes has introduced an improved version of its popular, ESP ESPA AFM probes. Brukers new line of ESP high quality premiumetched silicon probes set the industry standard for contact mode in air. The new design

TIP SPECIFICATIONS

Kelvin Probe Force Microscopy (KPFM)

It is to assist the machine vision application on Automated AFMs

the MPP is the industry standard for high-performance and high-quality imaging on a wide variety of sample types

Uncalibrated

Conductive PtSi Coating

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model FESP-V2

5 Side Angle: 22

METAL PROBE

A pack of 10 High quality etched silicon probes for soft TappingMode™imaging and force modulation in air

IRIS TF TERS Probe 5-Pack DESCRIPTION

0 Cantilever Geometry: Rectangular Back Side Coating: Reflective Aluminum