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Description

PFDT750DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS High aspect ratio probe for repeatable, accurate depth metrology and imaging on challenging structures such as deep trenches and pits, as encountered on semiconductor samples and optics. Designed for PeakForce Tapping operation on Dimension Icon. 750nm tall spike with 10nm end radius and 65nm base width Tip Geometry: Rotated (Symmetric) Tip Height: 3 8 Front Angle: 15+ 2 Back Angle: 25+ 2 Side

or contact resonance

Cantilever Material: Diamond nmech probe

100N/m Cantilever Thickness (Nom): 4 Cantilever Thickness (RNG): 3

FASTForce Volume

Tip Geometry: Standard Tip Height: 10 - 15 Front Angle: 25+/-2 Back Angle: 15+/-2 Side Angle: 17

For general imaging

and PF TUNA packages

and biosensors providing the prolonged tip lifetime in combination with boosted conductivity

The coating on the back side of the cantilever compensates for the stress created by the front side coating and also enhances laser reflectivity by a factor of up to 2

5um Cantilever Thickness (RNG): 1-2um Cantilever Geometry: Rectangular Cantilevers Number: 1 Back Side Coating: Reflective Au

Bruker recommends transitioning to this probe

25N/m nominal

Exchange/Return Notes