Magnification Calibration MRS-3 - Magnification Reference Standards

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Description

Magnification Calibration MRS-3 - Magnification Reference StandardsDESCRIPTION MRS 3 Reference Standard, X, Not Traceable, without Protective Retainer, Unmounted MRS 3 Reference Standard, X Y, Traceable, without Protective Retainer, Unmounted MRS 3 Reference Standard, X Y Z, Traceable, without Protective Retainer, Unmounted The 10 x 50,000x Pitch Standard for Scanning Electron Microscopy Details of Traceability to NIST, NPL or ISO 9000 Compliance Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB

of low electrical resistance and have surface properties equal to glass (including smoothness)

STM and AFM)

70 Cantilever Geometry: Rectangular Cantilevers Number: 1 Front Side Coating: Conductive Diamond Back Side Coating: Reflective Aluminum

An inexpensive way to store 10

55 Cantilever Geometry: Rectangular Cantilevers Number: 1 Front Side Coating: Conductive PtIr Back Side Coating: Reflective PtIr

High electrical performance due to its consistent tip shape

500x – 1

In addition

For the highest resolution SSRM measurements

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model RFESP-75

Peak Force QNM Sample Kit

Bar Width 26µm