Semiconductor devices. Mechanical and climatic test methods - Accelerated moisture resistance. Unbiased HAST Ingestion-build-232773

Semiconductor devices. Mechanical and climatic test methods - Accelerated moisture resistance. Unbiased HAST Ingestion-build-2327731 Scope and object The unbiased highly accelerated stress testing (HAST) is performed for the purpose of evaluating the reliability of non hermetically packaged solid state devices in humid environments. It is a highly accelerated test which employs temperature and humidity under non condensing conditions to accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external

with or without a jointing profile

3 Data sheet

Specific statutory

but the engineer undertaking the design needs to be aware of those items which will affect the design

moving relative to a measuring scale on a rigid beam and to a fixed jaw

• Calculation of going

Similar principles may apply to TSE agents

Positioning of the cylinder

Annex A (normative) Determination and calculation of water absorption

but remains current until 2009

prEN ISO 15609-4

ventilating and air conditioning systems are established in BS ISO 10263-4