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Description

Tap190Al-GTapping Mode AFM Probe with Long Cantilever DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Tapping Mode AFM Probe with Long Cantilever Monolithic silicon AFM probe for high frequency non contact and tapping mode operation. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is

SynapTek GridStick™ Staining (428KB PDF)

Alignment Pin

P and very small impurities of Fe and Mg can be found

Splash guards are included with purchase of fluid cantilever holders

114mm long

starts showing wear or already blunted without the need of scanning an entire image or doing an SEM inspection

micro-mechanical parts

DualBeam® or CrossBeam® instruments for subsequent TEM imaging

The conductivity of this nickel cement paint is approximately 20x better than graphite paint and approximately 10% of silver paint

5 Prong Tip 5WF 130mm NM-SS 16 x 8

FastScan-D probes have less than 3 degrees of bend

2µm Edge radius: ≤10nm Period: 3 ±0

Exchange/Return Notes

We offer a 30-day return/exchange service after receiving.
Final sale items are not eligible for returns or exchanges.
To process your return/exchange, please contact us at [email protected]
Please click here for more details>>> Return & Exchange Policy

Shipping Notes

Free Standard Shipping on $100+ Orders to the USA.
Except Preorder products are shipped in 48 hours.
Delivery to the USA:

Standard Shipping : 3-10 business days

If time is of the essence, please consider selecting expedited delivery for faster service.

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